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Be good at testing and be intelligent in control—— -
Be good at testing and be intelligent in control——
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+86 17620686374
After seven years of deep cultivation in the semiconductor field, we know that accurate process monitoring is the core of the semiconductor production process. Therefore, we have always fulfilled our mission of precise monitoring of the entire process of semiconductor manufacturing, controllable and self-research
Jinxin Intelligent Control WaferInst™ wafer temperature measurement systems, including Etch Temperature Sensor /Wet Temperature Sensor wireless wafer temperature measurement systems, TC Wafer wafer temperature measurement systems and RTD Wafe wafer temperature measurement systems products. The core indicators such as temperature measurement accuracy, response speed and stability have been benchmarked with the international top levels. TC Wafer wafer temperature measurement system provides high-precision contact measurement, RTD Wafe wafer temperature measurement system r achieves high-resolution resistance temperature monitoring, and Etch Temperature Sensor /Wet Temperature Sensor wireless wafer temperature measurement system has excellent in-situ real-time wireless temperature measurement capabilities, accurately meeting the stringent process requirements of advanced processes. At present, the entire series of products have achieved complete autonomy of core software algorithms, strictly follow high industry standards during the entire life cycle of R & D and manufacturing, and comprehensively benchmark imported equipment with China's intelligent manufacturing, providing semiconductor manufacturing with both top performance and safety barrier temperature measurement solutions.
Jinxin Intelligent Control MultiInst™ functional calibration tablets have reached the same standards as international mainstream imported equipment in terms of sensing and measurement accuracy, data acquisition stability and physical form specifications. In actual semiconductor production line applications, MultiInst™ calibration chips can provide highly reliable test data, fully meeting the technical requirements of advanced processes for process control. With localized manufacturing, the product not only achieves in-situ replacement of overseas high-end competitive products in terms of core performance, but also significantly reduces the procurement and operation and maintenance costs of all aspects of the fab, and provides a faster technical response cycle, which is substantially guaranteed. The high-efficiency and agile operation of the semiconductor manufacturing supply chain is guaranteed.
In-depth coverage of key process processes, we provide wafer-level sensing solutions that integrate temperature, mechanics and micro-environment monitoring to accurately capture chamber conditions and mechanical abnormalities, help you break the process black box and achieve the ultimate control of process yield.
